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Environmental Scanning Electron Microscope model Quanta 200 FEG with Oxford-EDS system IE250 X-MAX 80

Features: The Quanta 200 FEG

uses
a field-emission gun (FEG) electron source and can be switched between
three vacuum modes enabling the investigation of conductive, non-conductive and high-vacuum incompatible materials. It offers nanometer resolution and a high signal to noise ratio in both regular high vacuum and environmental (wet) modes. The EDS consists latest 80 mm2 SDD detector enables detection of elements under high resolution.

Performance: Three vacuum modes, samples can be studied in pressures up to 5 Torr., Wet STEM detector. The Wet STEM provides imaging at relative humidity conditions up to 100%, Manual user interface, EDS with 80 mm2 SDD detector.

Applications:  Surface morphology of all kinds of conductive and non conductive samples can be analyzed. Texture information by performing phase identification and orientation mapping can  be done by EDS.

Location:             Smita Lab, IIT Delhi, Hauz Khas.

 
Charges:             As applicable